{"id":4507,"date":"2026-01-11T18:50:17","date_gmt":"2026-01-11T17:50:17","guid":{"rendered":"https:\/\/us.edu.pl\/instytut\/iim\/?page_id=4507"},"modified":"2026-01-11T18:50:17","modified_gmt":"2026-01-11T17:50:17","slug":"pracownia-preparatyki-mikroskopowej","status":"publish","type":"page","link":"https:\/\/us.edu.pl\/instytut\/iim\/en\/nauka-badania\/laboratoria-pracownie\/pracownia-preparatyki-mikroskopowej\/","title":{"rendered":"Microscopic Preparation Laboratory"},"content":{"rendered":"

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The laboratory prepares specimens (thin foils) for Transmission Electron Microscopy (TEM) using mechanical, electrolytic, and ion polishing methods. The most common form of TEM specimens is thin foils. The preparation process involves cutting a 3 mm diameter disc, mechanically thinning them using sandpaper and mechanical thinners (dimple grinders), and then final polishing them using ion, electrolytic, or mechanical polishers. Electrolytic polishing is used for electrically conductive samples. The effectiveness of this method is very high if the electrolyte, temperature, and electropolishing current conditions are carefully selected. This method is not suitable for non-conductive materials. In such cases, ion thinning is used. A disc of ground metallic material is exposed to a stream of argon ions, which causes atoms to be ejected from the sample surface. This process takes place at locally elevated temperatures, which is a limitation in the case of low-melting materials.<\/p>\n<\/div>\r\n <\/div>\r\n <\/div>[\/vc_tta_section][vc_tta_section title=”Equipment” tab_id=”1645113822678-51a69647-60ce456e-2265″]\r\n

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Workshop equipment:<\/p>\n