{"id":4511,"date":"2026-01-12T13:49:59","date_gmt":"2026-01-12T12:49:59","guid":{"rendered":"https:\/\/us.edu.pl\/instytut\/iim\/?page_id=4511"},"modified":"2026-01-12T13:49:59","modified_gmt":"2026-01-12T12:49:59","slug":"pracownia-skaningowej-mikroskopii-elektronowej","status":"publish","type":"page","link":"https:\/\/us.edu.pl\/instytut\/iim\/en\/nauka-badania\/laboratoria-pracownie\/pracownia-skaningowej-mikroskopii-elektronowej\/","title":{"rendered":"Scanning Electron Microscopy Laboratory"},"content":{"rendered":"

[vc_row el_class=”container”][vc_column][vc_tta_tour][vc_tta_section title=”About” tab_id=”1645113822652-dbfa6435-85b9456e-2265″]\r\n

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The Scanning Electron Microscopy (SEM) laboratory is equipped with two JEOL scanning electron microscopes, type JSM64080 and JSM7100F. These microscopes are used to analyze sample surfaces in macro, micro, and nanoscale areas.<\/p>\n

The laboratory offers research on<\/strong> microstructure, morphology, surface topography, structural analysis, and analysis of the chemical composition of samples using EDS methods, such as point, line, and surface analysis, as well as crystallographic orientation analysis using EBSD.<\/p>\n

Operation and capabilities:<\/strong> SEM imaging is achieved by scanning the sample surface with an electron beam. The interaction of the beam with the sample material in a specific area is analyzed using multiple detectors, including SE, BE, EBSD, and XRF. SEM images are characterized by a large depth of field.<\/p>\n

Analysis of surface morphology and topography<\/strong> (using secondary electron (SE) and backscattered electron (BSE) detectors) allows for the determination of the surface quality of tested samples, e.g., protective coatings, material defects (damage), as well as the analysis of fractures and corrosion damage, and the characterization of the microstructure of the tested material.<\/p>\n

Chemical composition <\/strong>(qualitative and quantitative) is performed using energy-dispersive X-ray spectroscopy (EDS). After the sample is excited by an electron beam, the EDS detector analyzes the emitted X-ray radiation, identifying the elements present in the sample and their relative proportions. This allows for the determination of the chemical composition in macro, micro, and nano-regions at specific locations on the sample (point analysis), along a specific line (line analysis), and in a specific area (surface analysis \u2013 maps of the surface distribution of elements). Crystallographic phase orientation<\/strong> is performed using the backscattered electron diffraction (EBSD) technique. The laboratory is equipped with an ultramodern and high-speed EBSD camera manufactured by Oxford, a leading global manufacturer of electron diffraction systems.<\/p>\n

Using the EBSD technique, it is possible to determine information about the crystallographic structure of phases and the orientation of grains and nanocrystallites in a sample. It also allows for the analysis of local texture, phase composition, and stresses in crystalline and crystalline\/amorphous materials.<\/p>\n

Applications (materials)<\/strong><\/p>\n

In studies of all groups of engineering materials (metals, alloys, ceramics, polymers, composites). In biological and geological studies.<\/p>\n

Specific study characteristics<\/strong><\/p>\n

Sample preparation \u2013 the sample surface must be properly prepared and free from stresses generated during cutting and grinding. The sample is usually mounted on the microscope stage using conductive carbon tape. In the case of non-conductive or organic materials, it is necessary to perform Additional steps, such as coating with a thin layer of gold or carbon, are required to ensure adequate conductivity and image quality.<\/p>\n<\/div>\r\n <\/div>\r\n <\/div>[\/vc_tta_section][vc_tta_section title=”Equipment” tab_id=”1645113822678-51a69647-60ce456e-2265″]\r\n

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Workshop equipment:<\/p>\n