Research conducted in the laboratory focuses on characterizing the processes of obtaining single-crystal materials and products made from them using directional crystallization methods, as well as determining the structural perfection of such materials and products. The research focuses on single-crystals, composites with a single-crystal matrix or reinforcement containing single-crystal phases, and single-crystal superalloys used in aircraft applications.
In the laboratory, scientific research is conducted on the properties of multi-component metal alloys, metal silicides, composites, also with a fraction of the quasicrystalline phase, and single-crystal nickel-based superalloys.
The laboratory consists of the following labs:
- Lab of X-ray diffraction topography;
- Lab of precise measurement of lattice parameters;
- Lab of structural defects research of single-crystals;
- Single-crystal technology workshop.
Equipment of the labs:
- PANalytical MicroSource DY-601 X-ray diffractometer – the device enables X-ray diffraction topography of single-crystal materials with surface dimensions of approximately 7 cm × 5 cm. The diffractometer allows for visualization of structural defects on the entire surface of the tested crystals or specific fragments.
- EFG Freiberg Instruments XRT-100 high-resolution X-ray diffractometer – the device enables the study of single-crystal materials up to 10 cm in size using X-ray diffraction topography and the Laue method. It allows for the determination of the crystal orientation of selected sample areas and the visualization of structural defects across the entire surface of the examined crystals (approximately 100 cm²) or specific fragments. The diffractometer also enables high-resolution crystal analysis, including mapping of reciprocal lattice nodes..
- PANalytical X-ray diffracometer equipped with the Bond camera with temperature attachement – the device is used to precisely determine the lattice parameters of single-crystals, including optical crystals, e.g. strontium barium niobate (SrxBa1-xNb2O6). Additionally, it is possible to determine changes in the lattice parameters of single-crystals as a function of temperature (up to 600°C), which can be used to determine the phase transition temperature.
- VEM X-ray diffractometer with the Laue camera – a device enables the measurement of crystal orientation and the determination of crystal lattice symmetry in selected sample areas. Cameras enable measurements using the transmission and/or back-reflection technique.
