Research conducted in the laboratory focuses on the comprehensive analysis of the crystalline structure of materials using X-ray diffraction (XRD) techniques. The laboratory enables a full range of investigations – from diffraction measurements to advanced data analysis and interpretation. The main objective of the research includes phase identification, quantitative composition analysis, and detailed characterisation of the crystalline structure of powders, bulk materials, as well as thin films.
The laboratory is equipped with an X-ray diffractometer and dedicated computer workstations with HighScore software and access to the ICDD PDF-5+ database. This setup allows for precise analysis of diffraction patterns, comparison with an extensive set of reference data, and comprehensive computational evaluation. The laboratory provides an integrated research environment for advanced phase and structural characterisation of materials applied across various scientific and industrial fields.
- The laboratory is equipped with:
- Philips X’Pert Pro X-ray diffractometer – the diffractometer equipped with an X-ray tube with copper anode (λ CuKα = 1.54178 Å), allowing for an analysis of powders, bulk materials, ceramics, metals and alloys, polymers and composites. Thanks to its high measurement precision, it allows for the determination of crystallite size, degree of crystallinity, as well as macro- and microstrains, including residual stresses. The apparatus also supports measurement in grazing incidence mode (GIXRD), enabling detailed analysis of thin films and material surface.
